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https://www.selleckchem.com/products/acalabrutinib.html A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism and performance were investigated using freestanding nanometer-thin carbon membranes. The results demonstrate that the detector can be optimized either for most efficient signal collection or for maximum image contrast. The designed setup allows for the imaging of thin low-density materials that otherwise provide little signal or contrast and for a clear end-point detection in the fabrication of nanopores. In addition, the detector is able to determine the thickness of membranes with sub-nanometer precision by quantitatively evaluating the image signal and comparing the results with Monte Carlo simulations. The thickness determined by the dark-field transmission detector is compared to X-ray photoelectron spectroscopy and energy-filtered transmission electron microscopy measurements.When using the Oliver-Pharr method, the indented specimen is assumed to be a perfectly flat surface, thus ignoring the influences of surface roughness that might be encountered in experiment. For nanoindentation measurements, a flat surface is fabricated from curved specimens by mechanical polishing. However, the position of the polished curved surface cannot be controlled. There are no reliable theoretical or experimental methods to evaluate the mechanical behavior during nanoindentation of an elastic-plastic microsphere. Therefore, it is necessary to conduct reliable numerical simulations to evaluate this behavior. This article reports a systematic computational study regarding the instrumented nanoindentation of elastic-plastic microspherical materials. The ratio between elastic modulus of the microsphere and the initial yield stress of

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