https://www.selleckchem.com/products/d-1553.html Over the last two decades, organic photovoltaic (OPV) devices have seen their efficiency increase, while long-term stability and upscaling have been demonstrated for first-generation modules. Since the maturity level of this technology has now improved, techniques for rapid quality control have become relevant. Imaging techniques such as photo- and electroluminescence have already been used for this purpose. However, defects could only be localized either in the active layer or in interface layers, without being able to distinguish between defects located in the ETL from those within the HTL. Here, we present a simple method to unambiguously discriminate between ETL and HTL defects. Furthermore, we demonstrate the strong impact of HTL thickness on the detected photoluminescence signal. Our approach will help avoid misinterpretations in luminescence experiments and gain an understanding of device failure during processing or aging.Background Visceral artery pseudoaneurysms (VA-PSA) occur in necrotizing pancreatitis; however, little is known about their natural history. This study sought to evaluate the incidence and outcomes of VA-PSA in a large cohort of patients with necrotizing pancreatitis. Methods Data for patients with necrotizing pancreatitis who were treated between 2005 and 2017 at Indiana University Health University Hospital and who developed a VA-PSA were reviewed to assess incidence, presentation, treatment and outcomes. Results Twenty-eight of 647 patients with necrotizing pancreatitis (4.3%) developed a VA-PSA between 2005 and 2017. The artery most commonly involved was the splenic artery (36%), followed by the gastroduodenal artery (24%). The most common presenting symptom was bloody drain output (32%), followed by incidental computed tomographic findings (21%). The median time from onset of necrotizing pancreatitis to diagnosis of a VA-PSA was 63.5 days (range 1-957 d). Twenty-five of the 28 patients w